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X-ray Photoelectron Spectroscopy

Concept · Surface_analysis_methods_Vocabulary · Draft

Terms

  • Preferred term, Draft
  • Synonym, Draft

Definition

  • X-ray Photoelectron Spectroscopy (XPS) is widely used to investigate the chemical composition of surfaces. The ability to explore the first few atomic layers (5-10 nm) and assign chemical states to the detected atoms has shown XPS to be a powerful addition to any analytical laboratory.
    Surface analysis by XPS is accomplished by irradiating a sample with monoenergetic soft X-rays and analyzing the energy of the detected electrons. Mg Ka (1253.6 eV) or Al Ka (1486.6 eV) X-rays are usually used.

Note

    Example

      Additional technical information

      Organization
      • FAIR-Impact support action
      Created at
      19/09/2025, 11.14
      Modified at
      21/09/2025, 18.16
      URI
      http://hdl.handle.net/21.T13999/EOSC-202503000465814@concept=3d7b2957-343c-4831-ba79-a00b0c3d3285