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Measuring instrument

Concept · Surface_analysis_methods_Vocabulary · Draft

Terms

  • Preferred term, Draft

Definition

  • Device used for measurements
Subject area
Metrology, General Parameters

Note

  • Includes X-ray source, detector, and analyzer

Example

  • Kratos Axis Supra, PHI VersaProbe II

Additional technical information

Organization
  • FAIR-Impact support action
Created at
25/03/2025, 14.21
Modified at
14/04/2025, 4.29
URI
http://hdl.handle.net/21.T13999/EOSC-202503000465814@concept=e6c32e7a-c68f-4ef7-a36b-14cf1d2fa7c7