Surface_analysis_methods_Vocabulary

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Software used to process XPS spectra

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Voltage applied to the anode in the X-ray source

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Step size between energy points in a scan

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Reference materials used for calibration

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Molecular or atomic composition of the sample

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Type of coating applied to the sample

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File format used to store measurement results

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Energy resolution of the detector

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Electronic structure is a term used in chemistry and physics to describe the state of electrons within an atom or molecule, encompassing their arrangement, energy, and behavior. It dictates how atoms interact, forming the basis of chemical bonding. This structure is represented by electron configurations, which show the distribution of electrons in energy levels and orbitals around the nucleus.

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Current emitted from the X-ray source

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Final energy for spectrum measurement

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Electrical current used for ion etching

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Duration of ion etching

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Voltage applied during ion etching

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Sample treatment before insertion into the chamber

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Time required to complete the measurement

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Name of the specific measurement device

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Company that produced the instrument

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Year when the instrument was built

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Methods applied in data analysis

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Device used for measurements

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A monolayer is a single, closely packed layer of entities, commonly atoms or molecules

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Nanostructures are materials with nanometer scale sizes in one, two, or three dimensions. The term ‘nanostructure’ is loosely defined, but typically the dimensions of nanostructures are between 1 and 100 nm

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The way the sample is observed during measurement

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The working configuration of the instrument

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Energy at which electrons pass through the analyzer

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Angle between electron emission and surface normal

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Technique used to polish the sample surface

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Treatment applied before the measurement

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Temperature used during sample preparation

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Type of X-ray radiation used for measurements

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Specific name or label of the sample

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Temperature of the sample during measurement

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Category of material analyzed

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A scanning tunneling microscope is a type of scanning probe microscope used for imaging surfaces at the atomic level

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Angle between incident and detected electrons

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http://purl.bioontology.org/ontology/MESH/D012666

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Is a material in which the crystal lattice of the entire sample is continuous and unbroken to the edges of the sample, with no grain boundaries

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Angle at which X-rays hit the sample

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Energy of the X-ray source

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Power of the X-ray source

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Initial energy for spectrum measurement

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Material on which the sample is deposited

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Pressure in the analysis chamber

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X-ray Photoelectron Spectroscopy (XPS) is widely used to investigate the chemical composition of surfaces. The ability to explore the first few atomic layers (5-10 nm) and assign chemical states to the detected atoms has shown XPS to be a powerful addition to any analytical laboratory.
Surface analysis by XPS is accomplished by irradiating a sample with monoenergetic soft X-rays and analyzing the energy of the detected electrons. Mg Ka (1253.6 eV) or Al Ka (1486.6 eV) X-rays are usually used.

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X-ray Photoelectron Spectroscopy (XPS) is widely used to investigate the chemical composition of surfaces. The ability to explore the first few atomic layers and assign chemical states to the detected atoms has shown XPS to be a powerful addition to any analytical laboratory