Surface_analysis_methods_Vocabulary

Terminological vocabulary ·Valid

Name

Surface_analysis_methods_Vocabulary

Description

The surface_analysis_methods vocabulary describes standardized conditions and parameters applied in the analysis of the physicochemical properties of material surfaces in scientific research. It encompasses various spectroscopic analysis methods, including X-ray and ultraviolet photoelectron spectroscopy (XPS, UPS), Auger electron spectroscopy (AES), secondary ion mass spectrometry (SIMS), Raman spectroscopy, and near-edge X-ray absorption fine structure spectroscopy (NEXAFS). The vocabulary also covers the types of excitation sources (X-ray, electron, ion radiation), types of surface treatment (polishing, ion etching), characteristics of the analytical equipment used (analyzer type, year of manufacture, software), and the experimental conditions under which the analysis is conducted (vacuum chamber pressure, sample temperature, angle between the sample and the detector, and energy parameters). The vocabulary is intended to unify metadata related to surface analysis methods in materials science, solid-state physics, and nanotechnology, ensuring compatibility with FAIR principles (Findable, Accessible, Interoperable, Reusable).

Information domain

Consumer matters

Language

English EN

Vocabulary type

Terminological vocabulary

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You can inspect glossary, concept selection, and concept information in Excel file formats.

Organization

FAIR-Impact support action

Created at

20/03/2025, 19.24

Modified at

13/04/2025, 20.19

URI

http://hdl.handle.net/21.T13999/EOSC-202503000465814

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Vocabulary concepts

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Analysis softwareNo contributors

ConceptDraft

Software used to process XPS spectra

Anode voltageNo contributors

ConceptDraft

Voltage applied to the anode in the X-ray source

Binding energy stepNo contributors

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Step size between energy points in a scan

Calibration standardsNo contributors

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Reference materials used for calibration

Chemical formulaNo contributors

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Molecular or atomic composition of the sample

Coating typeNo contributors

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Type of coating applied to the sample

Data output formatNo contributors

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File format used to store measurement results

Detector resolutionNo contributors

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Energy resolution of the detector

Emission currentNo contributors

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Current emitted from the X-ray source

End binding energyNo contributors

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Final energy for spectrum measurement

Etching currentNo contributors

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Electrical current used for ion etching

Etching voltageNo contributors

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Voltage applied during ion etching

Ex-situ preparationNo contributors

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Sample treatment before insertion into the chamber

Experiment durationNo contributors

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Time required to complete the measurement

Instrument nameNo contributors

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Name of the specific measurement device

ManufacturerNo contributors

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Company that produced the instrument

Manufacturing yearNo contributors

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Year when the instrument was built

Mathematical models usedNo contributors

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Methods applied in data analysis

Measuring instrumentNo contributors

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Device used for measurements

MonolayerNo contributors

ConceptDraft

A monolayer is a single, closely packed layer of entities, commonly atoms or molecules

Nanostructures are materials with nanometer scale sizes in one, two, or three dimensions. The term ‘nanostructure’ is loosely defined, but typically the dimensions of nanostructures are between 1 and 100 nm